The P-TEC team had a highly productive and successful three days in Detroit when they welcomed visitors on to their stand at the Automotive Testing Expo 2005 North America at the end of October.

P-TEC engineers were on hand to talk about the services offered, and also demonstrating and promoting new innovations such as SDC150, their Secure Diagnostics Connector with embedded firewall functionality; PDL350 which is a personal, pocket-sized CAN Data Logger aimed at automotive professionals; and the P-LANet Modular Prototyping ECU system. View Our Products for more details.

P-TEC are also featured in the September 2005 issue of Automotive Testing Technology International Magazine, where a full page article can be found on page 116. Click on the Front Cover image on the right to read it. (PDF, 876kb, Acrobat Reader required).